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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/corr/abs-2308-11639>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haebom_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sungho_Suh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tae_Yeob_Kang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.48550%2FarXiv.2308.11639>
foaf:homepage <https://doi.org/10.48550/arXiv.2308.11639>
dc:identifier DBLP journals/corr/abs-2308-11639 (xsd:string)
dc:identifier DOI doi.org%2F10.48550%2FarXiv.2308.11639 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/corr>
rdfs:label In situ Fault Diagnosis of Indium Tin Oxide Electrodes by Processing S-Parameter Patterns. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haebom_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sungho_Suh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tae_Yeob_Kang>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/corr/abs-2308-11639/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/corr/abs-2308-11639>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/corr/corr2308.html#abs-2308-11639>
rdfs:seeAlso <https://doi.org/10.48550/arXiv.2308.11639>
dc:title In situ Fault Diagnosis of Indium Tin Oxide Electrodes by Processing S-Parameter Patterns. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume abs/2308.11639 (xsd:string)