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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/di/BlankesteijnFG23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aya_Fukami>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matthe%E2%88%9A%C4%BEs_B._Blankesteijn>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zeno_J._M._H._Geradts>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.fsidi.2023.301587>
foaf:homepage <https://doi.org/10.1016/j.fsidi.2023.301587>
dc:identifier DBLP journals/di/BlankesteijnFG23 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.fsidi.2023.301587 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/di>
rdfs:label Assessing data remnants in modern smartphones after factory reset. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aya_Fukami>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matthe%E2%88%9A%C4%BEs_B._Blankesteijn>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zeno_J._M._H._Geradts>
swrc:month September (xsd:string)
swrc:pages 301587 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/di/BlankesteijnFG23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/di/BlankesteijnFG23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/di/di46.html#BlankesteijnFG23>
rdfs:seeAlso <https://doi.org/10.1016/j.fsidi.2023.301587>
dc:title Assessing data remnants in modern smartphones after factory reset. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 46 (xsd:string)