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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/di/Zandwijk17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jan_Peter_van_Zandwijk>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.diin.2017.01.005>
foaf:homepage <https://doi.org/10.1016/j.diin.2017.01.005>
dc:identifier DBLP journals/di/Zandwijk17 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.diin.2017.01.005 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/di>
rdfs:label Bit-errors as a source of forensic information in NAND-flash memory. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jan_Peter_van_Zandwijk>
swrc:pages S12-S19 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/di/Zandwijk17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/di/Zandwijk17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/di/di20S.html#Zandwijk17>
rdfs:seeAlso <https://doi.org/10.1016/j.diin.2017.01.005>
dc:title Bit-errors as a source of forensic information in NAND-flash memory. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 Supplement (xsd:string)