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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/dt/0001LKCM24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_M._Carulli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ke_Huang_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nenad_Korolija>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yiorgos_Makris>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Liu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMDAT.2023.3283349>
foaf:homepage <https://doi.org/10.1109/MDAT.2023.3283349>
dc:identifier DBLP journals/dt/0001LKCM24 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMDAT.2023.3283349 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/dt>
rdfs:label Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_M._Carulli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ke_Huang_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nenad_Korolija>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yiorgos_Makris>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Liu>
swrc:number 2 (xsd:string)
swrc:pages 15-22 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/dt/0001LKCM24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/dt/0001LKCM24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/dt/dt41.html#0001LKCM24>
rdfs:seeAlso <https://doi.org/10.1109/MDAT.2023.3283349>
dc:title Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 41 (xsd:string)