System-in-Package Testing: Problems and Solutions.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/dt/AppelloBGR06
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https://dblp.l3s.de/d2r/resource/authors/Michelangelo_Grosso
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https://dblp.l3s.de/d2r/resource/authors/Paolo_Bernardi
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2006
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System-in-Package Testing: Problems and Solutions.
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203-211
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dc:
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System-on-Chip, System-on-Package, System-in-Package, SiP, SoC, test access mechanism, IEEE1500 SECT, KGD
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System-in-Package Testing: Problems and Solutions.
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