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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/dt/BreuerZ08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haiyang_%28Henry%29_Zhu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Melvin_A._Breuer>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMDT.2008.30>
foaf:homepage <https://doi.org/10.1109/MDT.2008.30>
dc:identifier DBLP journals/dt/BreuerZ08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMDT.2008.30 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/dt>
rdfs:label An Illustrated Methodology for Analysis of Error Tolerance. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haiyang_%28Henry%29_Zhu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Melvin_A._Breuer>
swrc:number 2 (xsd:string)
swrc:pages 168-177 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/dt/BreuerZ08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/dt/BreuerZ08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/dt/dt25.html#BreuerZ08>
rdfs:seeAlso <https://doi.org/10.1109/MDT.2008.30>
dc:subject error tolerance, telephone answering machine, yield, defective flash memory, mean opinion score (xsd:string)
dc:title An Illustrated Methodology for Analysis of Error Tolerance. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 25 (xsd:string)