Test compression saves bits, cycles, and money.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/dt/Cheng08a
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/dt/Cheng08a
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dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_%28Tim%29_Cheng
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foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FMDT.2008.52
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DBLP journals/dt/Cheng08a
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dc:
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dcterms:
issued
2008
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rdfs:
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Test compression saves bits, cycles, and money.
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<
https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_%28Tim%29_Cheng
>
swrc:
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2
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swrc:
pages
105
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owl:
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http://bibsonomy.org/uri/bibtexkey/journals/dt/Cheng08a/dblp
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owl:
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rdfs:
seeAlso
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http://dblp.uni-trier.de/db/journals/dt/dt25.html#Cheng08a
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rdfs:
seeAlso
<
https://doi.org/10.1109/MDT.2008.52
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dc:
subject
test compression, test vectors, DFT, RFIC chips, Bob Dennard
(xsd:string)
dc:
title
Test compression saves bits, cycles, and money.
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dc:
type
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