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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/dt/DavidsonD07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Helen_Davidson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Scott_Davidson_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMDT.2007.175>
foaf:homepage <https://doi.org/10.1109/MDT.2007.175>
dc:identifier DBLP journals/dt/DavidsonD07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMDT.2007.175 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/dt>
rdfs:label The Psychology of Electronic Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Helen_Davidson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Scott_Davidson_0001>
swrc:number 5 (xsd:string)
swrc:pages 494-501 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/dt/DavidsonD07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/dt/DavidsonD07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/dt/dt24.html#DavidsonD07>
rdfs:seeAlso <https://doi.org/10.1109/MDT.2007.175>
dc:subject designers, test engineers, DFT engineers, psychology of electronic test, psychological factors (xsd:string)
dc:title The Psychology of Electronic Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)