Guest Editor's Introduction: Getting More Out of Test. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/dt/Gattiker07>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Anne_Gattiker>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FMDT.2007.165>
foaf:homepage	<https://doi.org/10.1109/MDT.2007.165>
dc:identifier	DBLP journals/dt/Gattiker07 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FMDT.2007.165 (xsd:string)
dcterms:issued	2007 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/dt>
rdfs:label	Guest Editor's Introduction: Getting More Out of Test. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Anne_Gattiker>
swrc:number	5 (xsd:string)
swrc:pages	474-475 (xsd:string)
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rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/dt/dt24.html#Gattiker07>
rdfs:seeAlso	<https://doi.org/10.1109/MDT.2007.165>
dc:subject	International Test Conference, ITC, test engineers, designers, diagnosis, debugging, electronic test (xsd:string)
dc:title	Guest Editor's Introduction: Getting More Out of Test. (xsd:string)
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swrc:volume	24 (xsd:string)