Historical Perspective on Scan Compression.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/dt/KapurMW08
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https://dblp.l3s.de/d2r/resource/authors/Subhasish_Mitra
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https://dblp.l3s.de/d2r/resource/authors/Thomas_W._Williams
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http://dx.doi.org/doi.org%2F10.1109%2FMDT.2008.40
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2008
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Historical Perspective on Scan Compression.
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2
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114-120
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dc:
subject
IC testing, scan compression, test data volume reduction, test application time reduction
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title
Historical Perspective on Scan Compression.
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