A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/dt/KerzerhoCBACR06
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A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs.
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ADC, DAC, mixed-signal testing, DFT, SiP, system-in-package
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A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs.
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