New test paradigms for yield and manufacturability. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/dt/Madge05>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Robert_Madge>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FMDT.2005.67>
foaf:homepage	<https://doi.org/10.1109/MDT.2005.67>
dc:identifier	DBLP journals/dt/Madge05 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FMDT.2005.67 (xsd:string)
dcterms:issued	2005 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/dt>
rdfs:label	New test paradigms for yield and manufacturability. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Robert_Madge>
swrc:number	3 (xsd:string)
swrc:pages	240-246 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/dt/Madge05/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/dt/Madge05>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/dt/dt22.html#Madge05>
rdfs:seeAlso	<https://doi.org/10.1109/MDT.2005.67>
dc:subject	nanometer-era semiconductor, test paradigm, yield and manufacturability (xsd:string)
dc:title	New test paradigms for yield and manufacturability. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	22 (xsd:string)