The future of IC design, testing, and manufacturing.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/dt/Maly96
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Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/dt/Maly96
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly
>
foaf:
homepage
<
http://doi.ieeecomputersociety.org/10.1109/MDT.1996.10021
>
foaf:
homepage
<
http://dx.doi.org/10.1109%2FMDT.1996.10021
>
dc:
identifier
DBLP journals/dt/Maly96
(xsd:string)
dc:
identifier
DOI 10.1109%2FMDT.1996.10021
(xsd:string)
dcterms:
issued
1996
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/dt
>
rdfs:
label
The future of IC design, testing, and manufacturing.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly
>
swrc:
number
4
(xsd:string)
swrc:
pages
8, 89-91
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/dt/Maly96/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/dt/Maly96
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/dt/dt13.html#Maly96
>
rdfs:
seeAlso
<
http://doi.ieeecomputersociety.org/10.1109/MDT.1996.10021
>
dc:
title
The future of IC design, testing, and manufacturing.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
13
(xsd:string)