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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/dt/Maly96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly>
foaf:homepage <http://doi.ieeecomputersociety.org/10.1109/MDT.1996.10021>
foaf:homepage <http://dx.doi.org/10.1109%2FMDT.1996.10021>
dc:identifier DBLP journals/dt/Maly96 (xsd:string)
dc:identifier DOI 10.1109%2FMDT.1996.10021 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/dt>
rdfs:label The future of IC design, testing, and manufacturing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly>
swrc:number 4 (xsd:string)
swrc:pages 8, 89-91 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/dt/Maly96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/dt/Maly96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/dt/dt13.html#Maly96>
rdfs:seeAlso <http://doi.ieeecomputersociety.org/10.1109/MDT.1996.10021>
dc:title The future of IC design, testing, and manufacturing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 13 (xsd:string)