[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/dt/Maxwell03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_C._Maxwell>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMDT.2003.1232260>
foaf:homepage <https://doi.org/10.1109/MDT.2003.1232260>
dc:identifier DBLP journals/dt/Maxwell03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMDT.2003.1232260 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/dt>
rdfs:label Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_C._Maxwell>
swrc:number 5 (xsd:string)
swrc:pages 84-89 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/dt/Maxwell03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/dt/Maxwell03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/dt/dt20.html#Maxwell03>
rdfs:seeAlso <https://doi.org/10.1109/MDT.2003.1232260>
dc:title Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 (xsd:string)