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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/dt/MiyanoSN99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Katsuhiko_Sato>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kenji_Numata>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shinji_Miyano>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F54.748805>
foaf:homepage <https://doi.org/10.1109/54.748805>
dc:identifier DBLP journals/dt/MiyanoSN99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F54.748805 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/dt>
rdfs:label Universal Test Interface for Embedded-DRAM Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Katsuhiko_Sato>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kenji_Numata>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shinji_Miyano>
swrc:number 1 (xsd:string)
swrc:pages 53-58 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/dt/MiyanoSN99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/dt/MiyanoSN99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/dt/dt16.html#MiyanoSN99>
rdfs:seeAlso <https://doi.org/10.1109/54.748805>
dc:title Universal Test Interface for Embedded-DRAM Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)