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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/dt/NaikAM93>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frank_Agricola>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Samir_Naik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2F54.211524>
foaf:homepage <https://doi.org/10.1109/54.211524>
dc:identifier DBLP journals/dt/NaikAM93 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2F54.211524 (xsd:string)
dcterms:issued 1993 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/dt>
rdfs:label Failure Analysis of High-Density CMOS SRAMs: Using Realistic Defect Modeling and I/Sub DDQ/ Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frank_Agricola>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Samir_Naik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wojciech_Maly>
swrc:number 2 (xsd:string)
swrc:pages 13-23 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/dt/NaikAM93/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/dt/NaikAM93>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/dt/dt10.html#NaikAM93>
rdfs:seeAlso <https://doi.org/10.1109/54.211524>
dc:title Failure Analysis of High-Density CMOS SRAMs: Using Realistic Defect Modeling and I/Sub DDQ/ Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 10 (xsd:string)