Current-Based Testing for Deep-Submicron VLSIs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/dt/Sachdev01
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dcterms:
bibliographicCitation
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dc:
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2001
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Current-Based Testing for Deep-Submicron VLSIs.
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76-84
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Current-Based Testing for Deep-Submicron VLSIs.
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