ITC exhibits for fun and profit.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/dt/Sibert07
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/dt/Sibert07
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dc:
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<
https://dblp.l3s.de/d2r/resource/authors/Jill_Sibert
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foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FMDT.2007.174
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DBLP journals/dt/Sibert07
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dc:
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DOI doi.org%2F10.1109%2FMDT.2007.174
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dcterms:
issued
2007
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https://dblp.l3s.de/d2r/resource/journals/dt
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ITC exhibits for fun and profit.
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https://dblp.l3s.de/d2r/resource/authors/Jill_Sibert
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5
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swrc:
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512
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rdfs:
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http://dblp.uni-trier.de/db/journals/dt/dt24.html#Sibert07
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rdfs:
seeAlso
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https://doi.org/10.1109/MDT.2007.174
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dc:
subject
International Test Conference, ITC, Test Week, exhibits, test professionals, technical sessions
(xsd:string)
dc:
title
ITC exhibits for fun and profit.
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