Conference Reports.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/dt/X05h
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Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/dt/X05h
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FMDT.2005.106
>
foaf:
homepage
<
https://doi.org/10.1109/MDT.2005.106
>
dc:
identifier
DBLP journals/dt/X05h
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FMDT.2005.106
(xsd:string)
dcterms:
issued
2005
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/dt
>
rdfs:
label
Conference Reports.
(xsd:string)
swrc:
number
5
(xsd:string)
swrc:
pages
480-481
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/dt/X05h/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/dt/X05h
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/dt/dt22.html#X05h
>
rdfs:
seeAlso
<
https://doi.org/10.1109/MDT.2005.106
>
dc:
subject
ETS 05, TTTC, European Test Workshop, Eastern Europe, NATW 05, outlier screening, embedded test, defect-based test, yield management, analog test
(xsd:string)
dc:
title
Conference Reports.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
22
(xsd:string)