Soft-Spot Analysis: Targeting Compound Noise Effects in Nanometer Circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/dt/ZhaoDB05
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dc:
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https://dblp.l3s.de/d2r/resource/authors/Sujit_Dey
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https://dblp.l3s.de/d2r/resource/authors/Xiaoliang_Bai
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DBLP journals/dt/ZhaoDB05
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2005
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Soft-Spot Analysis: Targeting Compound Noise Effects in Nanometer Circuits.
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4
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362-375
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dc:
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B.8.1 Reliability, Testing, and Fault-Tolerance, G.4.g Reliability and robustness, B.7 Integrated Circuits
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Soft-Spot Analysis: Targeting Compound Noise Effects in Nanometer Circuits.
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