![[RDF data]](https://dblp.l3s.de/d2r/snorql/rdf_flyer.24.gif)
| Property | Value |
|---|---|
| dcterms:bibliographicCitation | <http://dblp.uni-trier.de/rec/bibtex/journals/eccc/000123b> |
| dc:creator | <https://dblp.l3s.de/d2r/resource/authors/Ryan_Williams_0001> |
| foaf:homepage | <https://eccc.weizmann.ac.il/report/2023/082> |
| dc:identifier | DBLP journals/eccc/000123b (xsd:string) |
| dcterms:issued | 2023 (xsd:gYear) |
| swrc:journal | <https://dblp.l3s.de/d2r/resource/journals/eccc> |
| rdfs:label | Self-Improvement for Circuit-Analysis Problems. (xsd:string) |
| foaf:maker | <https://dblp.l3s.de/d2r/resource/authors/Ryan_Williams_0001> |
| owl:sameAs | <http://bibsonomy.org/uri/bibtexkey/journals/eccc/000123b/dblp> |
| owl:sameAs | <http://dblp.rkbexplorer.com/id/journals/eccc/000123b> |
| rdfs:seeAlso | <http://dblp.uni-trier.de/db/journals/eccc/eccc2023.html#000123b> |
| rdfs:seeAlso | <https://eccc.weizmann.ac.il/report/2023/082> |
| dc:title | Self-Improvement for Circuit-Analysis Problems. (xsd:string) |
| dc:type | <http://purl.org/dc/dcmitype/Text> |
| rdf:type | swrc:Article |
| rdf:type | foaf:Document |
| swrc:volume | TR23 (xsd:string) |