Transient- and probabilistic neural network-based fault classification in EHV three-terminal lines. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Ravi_Kumar_Varma_Bhupatiraju>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Venkata_Ramana_Rao_Pulipaka>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Venkata_Sesha_Samba_Siva_Sarma_Dhanikonda>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.3906%2Felk-1611-172>
foaf:homepage	<https://doi.org/10.3906/elk-1611-172>
dc:identifier	DBLP journals/elektrik/BhupatirajuDP18 (xsd:string)
dc:identifier	DOI doi.org%2F10.3906%2Felk-1611-172 (xsd:string)
dcterms:issued	2018 (xsd:gYear)
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rdfs:label	Transient- and probabilistic neural network-based fault classification in EHV three-terminal lines. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Ravi_Kumar_Varma_Bhupatiraju>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Venkata_Ramana_Rao_Pulipaka>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Venkata_Sesha_Samba_Siva_Sarma_Dhanikonda>
swrc:number	2 (xsd:string)
swrc:pages	974-986 (xsd:string)
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dc:title	Transient- and probabilistic neural network-based fault classification in EHV three-terminal lines. (xsd:string)
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