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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/elektrik/KoseE23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Evren_Ekmek%E2%88%9A%C3%9Fi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Umut_K%E2%88%9A%E2%88%82se>
foaf:homepage <http://dx.doi.org/doi.org%2F10.55730%2F1300-0632.3973>
foaf:homepage <https://doi.org/10.55730/1300-0632.3973>
dc:identifier DBLP journals/elektrik/KoseE23 (xsd:string)
dc:identifier DOI doi.org%2F10.55730%2F1300-0632.3973 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/elektrik>
rdfs:label The effects of the dielectric substrate thickness and the loss tangent on the absorption spectrum: a comprehensive study considering the resonance type, the ground plane coupling, and the characterization setup. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Evren_Ekmek%E2%88%9A%C3%9Fi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Umut_K%E2%88%9A%E2%88%82se>
swrc:month January (xsd:string)
swrc:number 1 (xsd:string)
swrc:pages 97-111 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/elektrik/KoseE23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/elektrik/KoseE23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/elektrik/elektrik31.html#KoseE23>
rdfs:seeAlso <https://doi.org/10.55730/1300-0632.3973>
dc:title The effects of the dielectric substrate thickness and the loss tangent on the absorption spectrum: a comprehensive study considering the resonance type, the ground plane coupling, and the characterization setup. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 31 (xsd:string)