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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/entropy/LiuHXZYTCLY22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bin_Yan_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jian_Chen_0025>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lei_Li_0019>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Linlin_Zhu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mengnan_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuangzhan_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Siyu_Tan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoqi_Xi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Han>
foaf:homepage <http://dx.doi.org/doi.org%2F10.3390%2Fe24070967>
foaf:homepage <https://doi.org/10.3390/e24070967>
dc:identifier DBLP journals/entropy/LiuHXZYTCLY22 (xsd:string)
dc:identifier DOI doi.org%2F10.3390%2Fe24070967 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/entropy>
rdfs:label Multiscale Dense U-Net: A Fast Correction Method for Thermal Drift Artifacts in Laboratory NanoCT Scans of Semi-Conductor Chips. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bin_Yan_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jian_Chen_0025>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lei_Li_0019>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Linlin_Zhu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mengnan_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuangzhan_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Siyu_Tan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoqi_Xi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Han>
swrc:number 7 (xsd:string)
swrc:pages 967 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/entropy/LiuHXZYTCLY22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/entropy/LiuHXZYTCLY22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/entropy/entropy24.html#LiuHXZYTCLY22>
rdfs:seeAlso <https://doi.org/10.3390/e24070967>
dc:title Multiscale Dense U-Net: A Fast Correction Method for Thermal Drift Artifacts in Laboratory NanoCT Scans of Semi-Conductor Chips. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)