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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/esticas/HuFSC11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ching-Te_Chuang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming-Long_Fan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pin_Su>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vita_Pi-Ho_Hu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FJETCAS.2011.2163691>
foaf:homepage <https://doi.org/10.1109/JETCAS.2011.2163691>
dc:identifier DBLP journals/esticas/HuFSC11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FJETCAS.2011.2163691 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/esticas>
rdfs:label Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature Sensitivity. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ching-Te_Chuang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming-Long_Fan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pin_Su>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vita_Pi-Ho_Hu>
swrc:number 3 (xsd:string)
swrc:pages 335-342 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/esticas/HuFSC11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/esticas/HuFSC11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/esticas/esticas1.html#HuFSC11>
rdfs:seeAlso <https://doi.org/10.1109/JETCAS.2011.2163691>
dc:title Analysis of Ultra-Thin-Body SOI Subthreshold SRAM Considering Line-Edge Roughness, Work Function Variation, and Temperature Sensitivity. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 1 (xsd:string)