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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/AbramoviciS03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Charles_E._Stroud>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Miron_Abramovici>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1025126030727>
foaf:homepage <https://doi.org/10.1023/A:1025126030727>
dc:identifier DBLP journals/et/AbramoviciS03 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1025126030727 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label BIST-Based Delay-Fault Testing in FPGAs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Charles_E._Stroud>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Miron_Abramovici>
swrc:number 5 (xsd:string)
swrc:pages 549-558 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/AbramoviciS03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/AbramoviciS03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et19.html#AbramoviciS03>
rdfs:seeAlso <https://doi.org/10.1023/A:1025126030727>
dc:subject Built-In Self-Test; Field Programmable Gate Arrays; delay faults (xsd:string)
dc:title BIST-Based Delay-Fault Testing in FPGAs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 19 (xsd:string)