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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/AltetIW03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Wong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Josep_Altet>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1023717617973>
foaf:homepage <https://doi.org/10.1023/A:1023717617973>
dc:identifier DBLP journals/et/AltetIW03 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1023717617973 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Thermal Testing of Analogue Integrated Circuits: A Case Study. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Wong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Josep_Altet>
swrc:number 3 (xsd:string)
swrc:pages 353-357 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/AltetIW03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/AltetIW03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et19.html#AltetIW03>
rdfs:seeAlso <https://doi.org/10.1023/A:1023717617973>
dc:subject test of analogue ICs; built-in self-testing; thermal testing; CMOS technology; thermal analysis of ICs (xsd:string)
dc:title Thermal Testing of Analogue Integrated Circuits: A Case Study. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 19 (xsd:string)