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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/BhuniaRR05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arijit_Raychowdhury>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Swarup_Bhunia>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-005-6144-3>
foaf:homepage <https://doi.org/10.1007/s10836-005-6144-3>
dc:identifier DBLP journals/et/BhuniaRR05 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-005-6144-3 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arijit_Raychowdhury>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Swarup_Bhunia>
swrc:number 2 (xsd:string)
swrc:pages 147-159 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/BhuniaRR05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/BhuniaRR05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et21.html#BhuniaRR05>
rdfs:seeAlso <https://doi.org/10.1007/s10836-005-6144-3>
dc:subject Defect Oriented Testing (DOT); dynamic supply current (IDD); Fourier transform; wavelet transform (xsd:string)
dc:title Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 21 (xsd:string)