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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/BlantonH97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_P._Hayes>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008262321471>
foaf:homepage <https://doi.org/10.1023/A:1008262321471>
dc:identifier DBLP journals/et/BlantonH97 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008262321471 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Testability Properties of Divergent Trees. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_P._Hayes>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton>
swrc:number 3 (xsd:string)
swrc:pages 197-209 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/BlantonH97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/BlantonH97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et11.html#BlantonH97>
rdfs:seeAlso <https://doi.org/10.1023/A:1008262321471>
dc:subject fault detection; fault modeling; regular circuits; interactive logic arrays; structured circuits; test generation (xsd:string)
dc:title Testability Properties of Divergent Trees. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 11 (xsd:string)