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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/BorriHDGPV05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luigi_Dilillo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Magali_Hage-Hassan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Simone_Borri>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-005-6146-1>
foaf:homepage <https://doi.org/10.1007/s10836-005-6146-1>
dc:identifier DBLP journals/et/BorriHDGPV05 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-005-6146-1 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luigi_Dilillo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Magali_Hage-Hassan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Simone_Borri>
swrc:number 2 (xsd:string)
swrc:pages 169-179 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/BorriHDGPV05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/BorriHDGPV05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et21.html#BorriHDGPV05>
rdfs:seeAlso <https://doi.org/10.1007/s10836-005-6146-1>
dc:subject memory testing; dynamic faults; address decoders; core-cells (xsd:string)
dc:title Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 21 (xsd:string)