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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/BounceurMSR07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ahc%E2%88%9A%C2%AEne_Bounceur>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Emmanuel_Simeu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lu%E2%88%9A%E2%89%A0s_Rol%E2%88%9A%E2%89%A0ndez>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Salvador_Mir>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-007-5006-6>
foaf:homepage <https://doi.org/10.1007/s10836-007-5006-6>
dc:identifier DBLP journals/et/BounceurMSR07 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-007-5006-6 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ahc%E2%88%9A%C2%AEne_Bounceur>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Emmanuel_Simeu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lu%E2%88%9A%E2%89%A0s_Rol%E2%88%9A%E2%89%A0ndez>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Salvador_Mir>
swrc:number 6 (xsd:string)
swrc:pages 471-484 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/BounceurMSR07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/BounceurMSR07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et23.html#BounceurMSR07>
rdfs:seeAlso <https://doi.org/10.1007/s10836-007-5006-6>
dc:subject Analogue fault simulation; Catastrophic and parametric faults; Process deviations; Statistical modeling; Analogue test (xsd:string)
dc:title Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 23 (xsd:string)