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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/BrosaF99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anna_Maria_Brosa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joan_Figueras>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008388903741>
foaf:homepage <https://doi.org/10.1023/A:1008388903741>
dc:identifier DBLP journals/et/BrosaF99 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008388903741 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Characterization of Floating Gate Defects in Analog Cells. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anna_Maria_Brosa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joan_Figueras>
swrc:number 1-2 (xsd:string)
swrc:pages 23-31 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/BrosaF99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/BrosaF99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et14.html#BrosaF99>
rdfs:seeAlso <https://doi.org/10.1023/A:1008388903741>
dc:subject floating gate defect; analog testing; low-power/low-voltage analog circuits (xsd:string)
dc:title Characterization of Floating Gate Defects in Analog Cells. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 14 (xsd:string)