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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/BrownB07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jason_G._Brown>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-006-0552-x>
foaf:homepage <https://doi.org/10.1007/s10836-006-0552-x>
dc:identifier DBLP journals/et/BrownB07 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-006-0552-x (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jason_G._Brown>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._D._%28Shawn%29_Blanton>
swrc:number 2-3 (xsd:string)
swrc:pages 131-144 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/BrownB07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/BrownB07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et23.html#BrownB07>
rdfs:seeAlso <https://doi.org/10.1007/s10836-006-0552-x>
dc:subject fault diagnosis; integrated circuit testing; logic testing; nanoelectronics; fault coverage; fault diagnostic accuracy; high defect densities; nanofabrication; reconfigurability; regular architectures; nanoFabric (xsd:string)
dc:title A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 23 (xsd:string)