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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/BuonannoFS95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donatella_Sciuto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Franco_Fummi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giacomo_Buonanno>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00993087>
foaf:homepage <https://doi.org/10.1007/BF00993087>
dc:identifier DBLP journals/et/BuonannoFS95 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00993087 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label TIES: A testability increase expert system for VLSI design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donatella_Sciuto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Franco_Fummi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giacomo_Buonanno>
swrc:number 2 (xsd:string)
swrc:pages 203-217 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/BuonannoFS95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/BuonannoFS95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et6.html#BuonannoFS95>
rdfs:seeAlso <https://doi.org/10.1007/BF00993087>
dc:subject design for testability techniques; testable design; DfT advisor; testability analysis (xsd:string)
dc:title TIES: A testability increase expert system for VLSI design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 6 (xsd:string)