Fault Models and Test Generation for OpAmp Circuits - The FFM.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/CalvanoFAL01
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2001
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Fault Models and Test Generation for OpAmp Circuits - The FFM.
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121-138
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operational amplifiers; analog test; fault model; test generation
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Fault Models and Test Generation for OpAmp Circuits - The FFM.
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