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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/CascavalBH04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Corneliu_Hutanu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Petru_Cascaval>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stuart_Bennett>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FB%3AJETT.0000029457.21312.23>
foaf:homepage <https://doi.org/10.1023/B:JETT.0000029457.21312.23>
dc:identifier DBLP journals/et/CascavalBH04 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FB%3AJETT.0000029457.21312.23 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Corneliu_Hutanu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Petru_Cascaval>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stuart_Bennett>
swrc:number 3 (xsd:string)
swrc:pages 227-243 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/CascavalBH04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/CascavalBH04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et20.html#CascavalBH04>
rdfs:seeAlso <https://doi.org/10.1023/B:JETT.0000029457.21312.23>
dc:subject memory testing; functional faults; coupling faults; march test; fault simulation (xsd:string)
dc:title Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 (xsd:string)