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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/Chakraborty04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kanad_Chakraborty>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FB%3AJETT.0000009316.94309.66>
foaf:homepage <https://doi.org/10.1023/B:JETT.0000009316.94309.66>
dc:identifier DBLP journals/et/Chakraborty04 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FB%3AJETT.0000009316.94309.66 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Testing and Reliability Techniques for High-Bandwidth Embedded RAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kanad_Chakraborty>
swrc:number 1 (xsd:string)
swrc:pages 89-108 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/Chakraborty04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/Chakraborty04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et20.html#Chakraborty04>
rdfs:seeAlso <https://doi.org/10.1023/B:JETT.0000009316.94309.66>
dc:subject bandwidth; fault tolerance; reliability; multiport RAM; BIST (built-in self-test); BISR (built-in self-repair); column-multiplexed addressing (xsd:string)
dc:title Testing and Reliability Techniques for High-Bandwidth Embedded RAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 (xsd:string)