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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ChampacCF99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joan_Figueras>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Castillejos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008303427496>
foaf:homepage <https://doi.org/10.1023/A:1008303427496>
dc:identifier DBLP journals/et/ChampacCF99 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008303427496 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label IDDQ Testing of Opens in CMOS SRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joan_Figueras>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_Castillejos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac>
swrc:number 1-2 (xsd:string)
swrc:pages 53-62 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ChampacCF99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ChampacCF99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et15.html#ChampacCF99>
rdfs:seeAlso <https://doi.org/10.1023/A:1008303427496>
dc:subject opens; data retention faults; memory testing; IDDQ (xsd:string)
dc:title IDDQ Testing of Opens in CMOS SRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 15 (xsd:string)