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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ChandraC04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anshuman_Chandra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Krishnendu_Chakrabarty>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FB%3AJETT.0000023682.41142.44>
foaf:homepage <https://doi.org/10.1023/B:JETT.0000023682.41142.44>
dc:identifier DBLP journals/et/ChandraC04 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FB%3AJETT.0000023682.41142.44 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anshuman_Chandra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Krishnendu_Chakrabarty>
swrc:number 2 (xsd:string)
swrc:pages 199-212 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ChandraC04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ChandraC04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et20.html#ChandraC04>
rdfs:seeAlso <https://doi.org/10.1023/B:JETT.0000023682.41142.44>
dc:subject automatic test equipment (ATE); decompression architecture; embedded core testing; precomputed test sets; system-on-a-chip testing; test set encoding; testing time; variable-to-variable-length codes (xsd:string)
dc:title Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 (xsd:string)