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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ChehabPM06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ali_Chehab>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rafic_Z._Makki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saurabh_Patel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-006-4835-z>
foaf:homepage <https://doi.org/10.1007/s10836-006-4835-z>
dc:identifier DBLP journals/et/ChehabPM06 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-006-4835-z (xsd:string)
dcterms:issued 2006 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Scaling of iDDT Test Methods for Random Logic Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ali_Chehab>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rafic_Z._Makki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saurabh_Patel>
swrc:number 1 (xsd:string)
swrc:pages 11-22 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ChehabPM06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ChehabPM06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et22.html#ChehabPM06>
rdfs:seeAlso <https://doi.org/10.1007/s10836-006-4835-z>
dc:subject dynamic power supply current; design for current testability; resistive opens; resistive bridges; fault simulation; very deep sub-micron technologies; VDSM (xsd:string)
dc:title Scaling of iDDT Test Methods for Random Logic Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)