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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ChenB96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_L._Bushnell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xinghao_Chen_0003>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00136073>
foaf:homepage <https://doi.org/10.1007/BF00136073>
dc:identifier DBLP journals/et/ChenB96 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00136073 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Sequential circuit test generation using dynamic justification equivalence. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_L._Bushnell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xinghao_Chen_0003>
swrc:number 1 (xsd:string)
swrc:pages 9-33 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ChenB96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ChenB96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et8.html#ChenB96>
rdfs:seeAlso <https://doi.org/10.1007/BF00136073>
dc:subject automatic test pattern generation; justification; search decision spaces; stuck-at faults; test generation efficiency (xsd:string)
dc:title Sequential circuit test generation using dynamic justification equivalence. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 8 (xsd:string)