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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ChenBD02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sujit_Dey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoliang_Bai>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1016562011549>
foaf:homepage <https://doi.org/10.1023/A:1016562011549>
dc:identifier DBLP journals/et/ChenBD02 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1016562011549 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sujit_Dey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoliang_Bai>
swrc:number 4-5 (xsd:string)
swrc:pages 529-538 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ChenBD02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ChenBD02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et18.html#ChenBD02>
rdfs:seeAlso <https://doi.org/10.1023/A:1016562011549>
dc:subject interconnect; crosstalk; self-test; processor (xsd:string)
dc:title Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 18 (xsd:string)