Layout Driven Selection and Chaining of Partial Scan Flip-Flops.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/ChenH98
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bibliographicCitation
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http://dblp.uni-trier.de/rec/bibtex/journals/et/ChenH98
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dc:
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https://dblp.l3s.de/d2r/resource/authors/TingTing_Hwang
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1998
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Layout Driven Selection and Chaining of Partial Scan Flip-Flops.
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19-27
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dc:
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design for testability; digital testing; partial scan; layout optimization; matching; placement; global routing
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Layout Driven Selection and Chaining of Partial Scan Flip-Flops.
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