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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ChenL95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Beyin_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00996439>
foaf:homepage <https://doi.org/10.1007/BF00996439>
dc:identifier DBLP journals/et/ChenL95 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00996439 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Universal test set generation for CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Beyin_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
swrc:number 3 (xsd:string)
swrc:pages 313-323 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ChenL95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ChenL95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et6.html#ChenL95>
rdfs:seeAlso <https://doi.org/10.1007/BF00996439>
dc:subject automatic test generation; CMOS circuits; functional testing; universal test set; stuck-open faults (xsd:string)
dc:title Universal test set generation for CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 6 (xsd:string)