On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/ChristouMT08
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/et/ChristouMT08
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kyriakos_Christou
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Maria_K._Michael
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Spyros_Tragoudas
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1007%2Fs10836-007-5020-8
>
foaf:
homepage
<
https://doi.org/10.1007/s10836-007-5020-8
>
dc:
identifier
DBLP journals/et/ChristouMT08
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1007%2Fs10836-007-5020-8
(xsd:string)
dcterms:
issued
2008
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/et
>
rdfs:
label
On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kyriakos_Christou
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Maria_K._Michael
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Spyros_Tragoudas
>
swrc:
number
1-3
(xsd:string)
swrc:
pages
203-222
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/et/ChristouMT08/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/et/ChristouMT08
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/et/et24.html#ChristouMT08
>
rdfs:
seeAlso
<
https://doi.org/10.1007/s10836-007-5020-8
>
dc:
subject
Zero-suppressed binary decision diagram; Path delay faults; Irredundant sum-of-products; Delay testing; Critical path delay faults; Compact test generation
(xsd:string)
dc:
title
On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
24
(xsd:string)