Modeling Fault Coverage of Random Test Patterns.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/CuiSM03
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DBLP journals/et/CuiSM03
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2003
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Modeling Fault Coverage of Random Test Patterns.
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3
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271-284
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dc:
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probabilistic model; BIST; fault-coverage prediction; cost-benefit analysis of fault simulation; variance of fault coverage
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Modeling Fault Coverage of Random Test Patterns.
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