Exhaustive and Near-Exhaustive Memory Testing Techniques and their BIST Implementations.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/DasK97
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/et/DasK97
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Debaleena_Das
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mark_G._Karpovsky
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008215624768
>
foaf:
homepage
<
https://doi.org/10.1023/A:1008215624768
>
dc:
identifier
DBLP journals/et/DasK97
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1023%2FA%3A1008215624768
(xsd:string)
dcterms:
issued
1997
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/et
>
rdfs:
label
Exhaustive and Near-Exhaustive Memory Testing Techniques and their BIST Implementations.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Debaleena_Das
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mark_G._Karpovsky
>
swrc:
number
3
(xsd:string)
swrc:
pages
215-229
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/et/DasK97/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/et/DasK97
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/et/et10.html#DasK97
>
rdfs:
seeAlso
<
https://doi.org/10.1023/A:1008215624768
>
dc:
subject
memory testing; pattern sensitive faults; built-in self-test; exhaustive codes; near-exhaustive codes
(xsd:string)
dc:
title
Exhaustive and Near-Exhaustive Memory Testing Techniques and their BIST Implementations.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
10
(xsd:string)