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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/DililloGPVB07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luigi_Dilillo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Magali_Bastian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-007-5003-9>
foaf:homepage <https://doi.org/10.1007/s10836-007-5003-9>
dc:identifier DBLP journals/et/DililloGPVB07 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-007-5003-9 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luigi_Dilillo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Magali_Bastian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch>
swrc:number 5 (xsd:string)
swrc:pages 435-444 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/DililloGPVB07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/DililloGPVB07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et23.html#DililloGPVB07>
rdfs:seeAlso <https://doi.org/10.1007/s10836-007-5003-9>
dc:subject Memory testing; Dynamic faults; Resistive-open defects; Pre-charge circuits (xsd:string)
dc:title Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 23 (xsd:string)