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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/DominguezADT06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guido_Torelli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._Francisco_Duque-Carrillo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_L._Aus%E2%88%9A%E2%89%A0n>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Miguel_Angel_Dom%E2%88%9A%E2%89%A0nguez>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-006-9503-9>
foaf:homepage <https://doi.org/10.1007/s10836-006-9503-9>
dc:identifier DBLP journals/et/DominguezADT06 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-006-9503-9 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guido_Torelli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Francisco_Duque-Carrillo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jos%E2%88%9A%C2%A9_L._Aus%E2%88%9A%E2%89%A0n>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Miguel_Angel_Dom%E2%88%9A%E2%89%A0nguez>
swrc:number 4-6 (xsd:string)
swrc:pages 437-448 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/DominguezADT06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/DominguezADT06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et22.html#DominguezADT06>
rdfs:seeAlso <https://doi.org/10.1007/s10836-006-9503-9>
dc:subject analog built-in self-test; analog IC test; on-chip spectrum analyzer; switched-capacitor circuits; non-uniform sampling (xsd:string)
dc:title A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)