Reusing Scan Chains for Test Pattern Decompression.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/DorschW02
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https://dblp.l3s.de/d2r/resource/authors/Rainer_Dorsch
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2002
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Reusing Scan Chains for Test Pattern Decompression.
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231-240
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dc:
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system-on-a-chip; embedded test; BIST
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title
Reusing Scan Chains for Test Pattern Decompression.
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